@prefix isq: <https://w3id.org/standards/isq/ontologies/core/> .
@prefix smart: <https://example.org/smart-sdu/> .
@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#> .
@prefix dcterms: <http://purl.org/dc/terms/> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .

<isq:t12-32.2>
  a isq:Entry ;
  rdf:type isq:Quantity ;
  rdf:type smart:TermEntry ;
  dcterms:identifier "12-32.2" ;
  skosxl:prefLabel "carrier lifetime <semiconductors>"@en ;
  skosxl:altLabel "tau"@en ;
  skosxl:altLabel "tau_\"n\""@en ;
  skosxl:altLabel "tau_\"p\""@en ;
  skos:definition "time constant (<<iso80000-3>>) for recombination or trapping of minority charge carriers in semiconductors"@en ;
  smart:hasBindingnessType "bindingness-type:normative" ;
  dcterms:isPartOf <isq:part-12> ;
  isq:hasUnit [
    skos:notation "s" ;
    skosxl:prefLabel "second"@en
  ] ;
  skos:note "Indices \"stem:[\"n\"]\" and \"stem:[\"p\"]\" denote negative and positive charge carriers, respectively. Positive charge carriers can also be holes."@en ;
  iso:urn <urn:iso:std:iso:80000:-12:ed-2:en:item:12-32.2> .
